MX-NIR

MX-NIR   NEAR INFRARED MICROSCOPE

 

MX-NIR   NEAR INFRARED MICROSCOPE

Industrial Infrared Microscopy imaging system can observe the interior of packaged chips and wafers in real time.

The infrared band(900-1700nm) has a wide spectral range, small scattering and strong penetration into silicon wafers.

It adopts a wide field illumination and area array detection to achieve wide spectrum, large FOV and high resolution imaging.

The Large Numerical Aperture Objectives lenses (with adjusting ring) can eliminate aberrations by coverage of the object to be measured, achieving effective and accurate infrared detection.

 

For more information read pdf below or contact us.

MX-NIR brochure: NIR-MX IR microscope